Skip to Main Content
Past and Current Projects
- 3D structure function of surfaces
- 3D tolerance control
- 5 axis coordinate measuring machine (MCM) uncertainty
- Adaptive sampling techniques
- Characterization of structured surfaces
- CMM contact scanning of edges and corners
- Combined moire-interference metrology • Environmentally tolerant SWLI characterization
- Error budget software for machine tools • Freeform metrology
- Laser tracker dynamic performance
- MicroCMM baseline metrology
- Non-axisymmetric artifacts
- Open metrology software
- Rough surface metrology
- Part manufacturing information
- Scanned profile uncertainties
- Spectral imaging metrology
- Tolerance specification consistency
- Vision CMM calibration techniques
- Wavelength shifting interferometry
- Compressed sampling microscope
- Computed tomography standards
- Dynamic range extension for optical imaging
- Fast tool servo for diamond turning non-axisymmetric components
- Giant magnetoresistive sensor design
- Grazing incidence metrology
- Instrumentation for crankshaft metrology
- MilliKelvin temperature control
- Nanoimprint lithography positioning stage
- Nanometric dilatometer
- Nanoscale hardness instrumentation
- Speckle scales for two dimensions
- Sub-atomic measuring machine
- Vectored touch sensor
- Wavelength stabilization of laser diodes
- Wettability characterization
- Whitelight fiber optic interferometry probe
- X-ray microscope development
- Ceramic machining
- Deformation machining
- Diamond films for manufacturing
- Error correction for freeform machining
- Machine tool geometric error correction
- Metals affordability initiative
- Molecular dynamics of machining
- Process damping in milling
- Subscale machining of large components
- Thermal modeling
- Tool tuning for machining centers
- Tool path modulation characterization
- Vibration assisted diamond turning
- Virtual manufacturing